Title :
Enhancing the performance of feature selection algorithms for classifying hyperspectral imagery
Author :
Kumar, Mukesh ; Duffy, Christopher J. ; Reed, Patrick M.
Author_Institution :
Dept. of Civil & Environ. Eng., Pennsylvania State Univ., Philadelphia, PA, USA
Abstract :
A method for enhancing the performance of feature selection algorithms is proposed. The proposed method is a two step process - first a feature subset is selected with optimum mutual information content and then this subset is searched to find a smaller subset, which has the best separability between classes. A subset with "optimum" mutual information content is the one which contains most of the information that is present in the rest of set. An expression has been derived to find such a subset efficiently. The two-step process is shown to reduce the search space drastically. The method is implemented with a simple genetic algorithm (SGA) and tested using hyperspectral remote-sensing images (acquired by AVIRIS sensor) as a data set. Theoretical result shows that the proposed method reduces the computation load by 90%. A computational efficiency to the order ∼20% is obtained on the implementation of proposed method with SGA. The method is sufficiently general to be used to enhance other feature selection algorithms.
Keywords :
feature extraction; genetic algorithms; geophysical signal processing; geophysical techniques; image classification; multidimensional signal processing; remote sensing; AVIRIS sensor; class separability; feature selection algorithms; feature subset selection; hyperspectral image classification; hyperspectral remote-sensing images; optimum mutual information; search algorithms; search space; simple genetic algorithm; subset searching; Computational efficiency; Genetic algorithms; Genetic programming; Hyperspectral imaging; Hyperspectral sensors; Image sensors; Information analysis; Mutual information; Remote sensing; Testing;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2004. IGARSS '04. Proceedings. 2004 IEEE International
Print_ISBN :
0-7803-8742-2
DOI :
10.1109/IGARSS.2004.1370398