Title :
Static, Dynamic, and Application-Level SEE Results for a 49-Core RHBD Processor
Author :
Wie, B. ; Plante, M.K. ; Berkley, Andrew ; Guertin, Steven M. ; Nejad, R.J.
Author_Institution :
Integrity Applic. Inc., Chantilly, VA, USA
Abstract :
Recent dynamic and static results are presented on a 49-core RHBD processor. Dynamic cache results show increased SEE susceptibility over static tests. Application level testing shows good correlation to low level cache results.
Keywords :
cache storage; microprocessor chips; multiprocessing systems; radiation hardening (electronics); semiconductor device testing; 49-core RHBD processor; SEE susceptibility; application level testing; dynamic cache results; low level cache results; static results; Image coding; Registers; Software; Testing; Tiles; Transform coding; Virtual machine monitors;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658217
