Title :
60 GHz power performance of 0.1 μm gate-length InAlAs/InGaAs HEMTs
Author :
Ho, Pin ; Smith, P.M. ; Hwang, K.C. ; Wang, S.C. ; Kao, M.Y. ; Chao, P.C. ; Liu, S.M.J.
Author_Institution :
Martin Marietta Labs., Syracuse, NY, USA
Abstract :
We report the DC and power results for 0.1 μm gate-length double heterojunction InAlAs/InGaAs HEMTs with lattice-matched, pseudomorphic and p-type InGaAs channels. At 60 GHz, 0.1 μm×50 μm HEMTs with a lattice-matched channel yielded peak power-added efficiency (PAE) of 49% with power density of 0.30 W/mm and power gain of 8.6 dB. When biased and tuned for maximum output power, the devices delivered 20.6 mW output power (0.41 W/mm power density) with 45% PAE and 8.0 dB power gain. The p-channel devices exhibited a lower output power density and efficiency due to the low channel current. The 200 μm wide devices with pseudomorphic channel demonstrated 50% PAE with 6.7 dB power gain and 0.30 W/mm power density. Furthermore, the 400 μm wide pseudomorphic channel devices delivered an output power of 192 mW (0.48 W/mm power density) with 30% PAE and 4.4 dB power gain. These results represent the highest PAE and power gain ever reported for any transistor at 60 GHz
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; power transistors; solid-state microwave devices; 0.1 micron; 192 mW; 20.6 mW; 30 to 50 percent; 4.4 to 8.6 dB; 60 GHz; DC performance; InAlAs-InGaAs; double heterojunction InAlAs/InGaAs HEMTs; lattice-matched channel; output power density; p-channel devices; peak power-added efficiency; power gain; power performance; pseudomorphic channel devices; Current density; Gain; HEMTs; Indium compounds; Indium gallium arsenide; MODFETs; Power generation; Power measurement; Temperature; Transconductance;
Conference_Titel :
Indium Phosphide and Related Materials, 1994. Conference Proceedings., Sixth International Conference on
Conference_Location :
Santa Barbara, CA
Print_ISBN :
0-7803-1476-X
DOI :
10.1109/ICIPRM.1994.328257