DocumentCode :
2149644
Title :
TID Test Results for 4th Generation iPad™
Author :
Guertin, Steven M. ; Allen, G.R. ; McClure, S.S. ; LaBel, Kenneth A.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear :
2013
fDate :
8-12 July 2013
Firstpage :
1
Lastpage :
6
Abstract :
TID testing results of 4th generation iPad tablet computers are reported. Of iPad subsystems, results indicate that the charging circuitry and display drivers fail at lowest TID levels. Details of construction are investigated for additional testing of components.
Keywords :
aerospace computing; aerospace testing; computer displays; driver circuits; notebook computers; power supply circuits; radiation effects; TID test results; charging circuit; display driver; fourth generation iPad; iPad subsystem; tablet computer; total ionizing radiation; Batteries; Magnetometers; Performance evaluation; Protons; Tablet computers; Temperature measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
ISSN :
2154-0519
Print_ISBN :
978-1-4799-1136-3
Type :
conf
DOI :
10.1109/REDW.2013.6658219
Filename :
6658219
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2149644
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