• DocumentCode
    2149644
  • Title

    TID Test Results for 4th Generation iPad™

  • Author

    Guertin, Steven M. ; Allen, G.R. ; McClure, S.S. ; LaBel, Kenneth A.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    TID testing results of 4th generation iPad tablet computers are reported. Of iPad subsystems, results indicate that the charging circuitry and display drivers fail at lowest TID levels. Details of construction are investigated for additional testing of components.
  • Keywords
    aerospace computing; aerospace testing; computer displays; driver circuits; notebook computers; power supply circuits; radiation effects; TID test results; charging circuit; display driver; fourth generation iPad; iPad subsystem; tablet computer; total ionizing radiation; Batteries; Magnetometers; Performance evaluation; Protons; Tablet computers; Temperature measurement; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2013 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4799-1136-3
  • Type

    conf

  • DOI
    10.1109/REDW.2013.6658219
  • Filename
    6658219
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2149644