• DocumentCode
    2149657
  • Title

    Capturing vulnerability variations for register files

  • Author

    Carretero, Javier ; Herrero, Enric ; Monchiero, Matteo ; Ramirez, Tanausu ; Vera, Xavier

  • Author_Institution
    Intel Barcelona Research Center, Intel Labs, Portugal
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    1468
  • Lastpage
    1473
  • Abstract
    Soft error rates are estimated based on worst-case architectural vulnerability factor (AVF). Therefore, it makes tracking real-time accurate AVF very attractive to computer designers: more accurate AVF numbers will allow turning on more features at runtime while keeping the promised SDC and DUE rates. This paper presents a hardware mechanism based on linear regressions to estimate the AVF (SDC and DUE) of the register file for out-of-order cores. Our results show that we are able to have a high correlation factor at low cost.
  • Keywords
    Correlation; Registers; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.299
  • Filename
    6513745