Title :
Capturing vulnerability variations for register files
Author :
Carretero, Javier ; Herrero, Enric ; Monchiero, Matteo ; Ramirez, Tanausu ; Vera, Xavier
Author_Institution :
Intel Barcelona Research Center, Intel Labs, Portugal
Abstract :
Soft error rates are estimated based on worst-case architectural vulnerability factor (AVF). Therefore, it makes tracking real-time accurate AVF very attractive to computer designers: more accurate AVF numbers will allow turning on more features at runtime while keeping the promised SDC and DUE rates. This paper presents a hardware mechanism based on linear regressions to estimate the AVF (SDC and DUE) of the register file for out-of-order cores. Our results show that we are able to have a high correlation factor at low cost.
Keywords :
Correlation; Registers; Training;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
Print_ISBN :
978-1-4673-5071-6
DOI :
10.7873/DATE.2013.299