Title :
TID Tolerance of Popular CubeSat Components
Author :
Kingsbury, R. ; Schmidt, F. ; Cahoy, K. ; Sklair, D. ; Blackwell, W. ; Osarentin, I. ; Legge, Ryan
Author_Institution :
Space Syst. Lab., Massachusetts Inst. of Technol., Cambridge, MA, USA
Abstract :
In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, popular microcontrollers (PIC24), SD memory cards and a TCXO.
Keywords :
aerospace components; aerospace instrumentation; analogue integrated circuits; artificial satellites; dosimetry; memory cards; microcontrollers; COTS component; CubeSats; PIC24; SD memory card; TCXO; TID tolerance; analog integrated circuits; microcontroller; total dose test; total ionizing dose; Ash; Charge pumps; Current measurement; Microcontrollers; Microwave radiometry; Performance evaluation; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658220
