• DocumentCode
    2149687
  • Title

    TID Tolerance of Popular CubeSat Components

  • Author

    Kingsbury, R. ; Schmidt, F. ; Cahoy, K. ; Sklair, D. ; Blackwell, W. ; Osarentin, I. ; Legge, Ryan

  • Author_Institution
    Space Syst. Lab., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, popular microcontrollers (PIC24), SD memory cards and a TCXO.
  • Keywords
    aerospace components; aerospace instrumentation; analogue integrated circuits; artificial satellites; dosimetry; memory cards; microcontrollers; COTS component; CubeSats; PIC24; SD memory card; TCXO; TID tolerance; analog integrated circuits; microcontroller; total dose test; total ionizing dose; Ash; Charge pumps; Current measurement; Microcontrollers; Microwave radiometry; Performance evaluation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2013 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4799-1136-3
  • Type

    conf

  • DOI
    10.1109/REDW.2013.6658220
  • Filename
    6658220
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2149687