• DocumentCode
    2149710
  • Title

    Total Dose and Single Event Effects Testing of the Intersil ISL70444SEH Hardened Operational Amplifier

  • Author

    van Vonno, N.W. ; Williams, Barry ; Hood, Robert ; Thomson, E.J. ; Bernard, S.K.

  • Author_Institution
    Intersil Corp., Palm Bay, FL, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL70444SEH hardened operational amplifier together with a discussion of the part´s electrical specifications and wafer fabrication process.
  • Keywords
    integrated circuit testing; operational amplifiers; semiconductor technology; Intersil ISL70444SEH; electrical specifications; hardened operational amplifier; single event effects testing; total dose effects testing; wafer fabrication process; Annealing; Monitoring; Operational amplifiers; Power supplies; Radiation effects; Testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2013 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4799-1136-3
  • Type

    conf

  • DOI
    10.1109/REDW.2013.6658221
  • Filename
    6658221
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2149710