Title :
Total Ionizing Dose Characterization of the Calibration Circuit of Texas Instruments´ ADC12D1600CCMLS, 12b, 3.2 GSPS Analog-to-Digital Converter
Author :
Kruckmeyer, Kirby ; Trinh, Thang ; Park, Lisa
Author_Institution :
Texas Instrum., Santa Clara, CA, USA
Abstract :
In situ testing of a high speed Analog-to-Digital Converter under gamma irradiation is impractical. A special test was developed to characterize the stability of the calibration of Texas Instruments´ ADC12D1600CCMLS over a Total Ionizing Dose exposure to 300 krad(Si).
Keywords :
analogue-digital conversion; avionics; gamma-rays; radiation hardening (electronics); ADC12D1600CCMLS ADC; Texas Instruments; calibration circuit; gamma irradiation; high speed analog-digital converter; in situ testing; storage capacity 12 bit; total ionizing dose characterization; Calibration; Clocks; Power demand; Radiation effects; Registers; Testing; Vectors;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658222
