Title :
TDC with 1.5% DNL based on a single-stage vernier delay-loop fine interpolation
Author :
Tamborini, Davide ; Markovic, Branko ; Tisa, Simone ; Villa, F.A. ; Tosi, Alberto
Author_Institution :
Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy
Abstract :
We present a compact TDC Module based on the Time-to-Digital Converter ASIC fabricated in 0.35 μm CMOS technology. This chip measures the time-interval between two inputs, called START and STOP, with a 10 ps resolution when using a 10 ns reference clock. Thanks to the structure, composed by two independent “interpolators” for each input and a “coarse” counter, the TDC chip can reach an average precision better than 15 psRMS and a differential non-linearity (DNL) smaller than 0.9 %LSB with a maximum conversion rate of about 3 Msps. A simple calibration allows to compute proper coefficients to apply to raw data. The TDC Module is composed by two SMA inputs, followed by an electronic front-end to provide compatibility to any kind of signal, an USB 2.0 connector for parameters setting and data upload to a remote computer and the power supply connector.
Keywords :
CMOS integrated circuits; application specific integrated circuits; interpolation; power supply circuits; time-digital conversion; CMOS technology; DNL; compact TDC module; differential nonlinearity; power supply connector; single-stage Vernier delay-loop fine interpolation; time-to-digital converter ASIC; Calibration; Clocks; Delays; Interpolation; Radiation detectors; Synchronization; Coarse-Fine interpolation; Time-correlated Single-Photon Counting (TCSPC); Time-to-Digital Converter (TDC); Vernier delay line;
Conference_Titel :
Time-to-Digital Converters (NoMe TDC), 2013 IEEE Nordic-Mediterranean Workshop on
Conference_Location :
Perugia
Print_ISBN :
978-1-4799-1184-4
DOI :
10.1109/NoMeTDC.2013.6658231