• DocumentCode
    2150775
  • Title

    Nonlinear Dynamics in Semiconductor Lasers and VCSELs

  • Author

    Ohtsubo, Junji

  • Author_Institution
    Shizuoka Univ., Hamamatsu
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The studies of dynamics properties for these lasers are important not only from a fundamental physical aspect of nonlinear dynamics and chaos but also applications. Both edge-emitting semiconductor lasers with external perturbations and VCSELs with and without external perturbations are excellent models for chaos systems, since a rich variety of nonlinear dynamics can be observed. Also these chaotic lasers are applied as light sources for secure communications. In this review, the author focuses on the effects of optical feedback and optical injection both for edge-emitting narrow-stripe semiconductor lasers and VCSELs. Some nonlinear dynamics in edge-emitting semiconductor lasers with optical feedback and optical injection are presented. Next nonlinear dynamics in VCSELs with optical feedback and optical injection are described by taking into considerations of polarization and spatial-mode oscillations.
  • Keywords
    laser beams; laser cavity resonators; laser feedback; light polarisation; nonlinear dynamical systems; optical chaos; surface emitting lasers; VCSEL; chaos system model; chaotic lasers; edge-emitting narrow-stripe semiconductor lasers; light polarization; nonlinear dynamics; optical feedback; optical injection; spatial-mode oscillations; vertical-cavity surface-emitting semiconductor laser; Chaotic communication; Laser feedback; Laser modes; Laser theory; Light sources; Nonlinear optics; Optical feedback; Optical polarization; Semiconductor lasers; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-0931-0
  • Electronic_ISBN
    978-1-4244-0931-0
  • Type

    conf

  • DOI
    10.1109/CLEOE-IQEC.2007.4385988
  • Filename
    4385988