DocumentCode :
2151112
Title :
Comparison of wavelength splitting for transverse VCSEL modes
Author :
Young, E.W. ; Choquette, K.D. ; Chuang, S.L. ; Geib, K.M. ; Allerman, A.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear :
2002
fDate :
2002
Abstract :
Summary form only given. Recently we reported high-power single-fundamental mode operation of an 850-nm vertical cavity laser using a hybrid ion implanted/selectively oxidized structure. By using two types of apertures, the current can be selectively injected through the smaller implant aperture into the fundamental mode producing lasing in a single transverse mode. In this paper, we characterize the behavior of hybrid VCSELs through the wavelength splitting between the fundamental mode (LP01,) and the first higher order mode (LP), and compare to those found in selectively oxidized and proton implanted VCSELs grown on the same wafer.
Keywords :
infrared sources; ion implantation; laser modes; laser transitions; oxidation; semiconductor lasers; surface emitting lasers; 850 nm; apertures; first higher order mode; fundamental mode; fundamental mode lasing; high-power single-fundamental mode operation; hybrid VCSELs; hybrid ion implanted/selectively oxidized structure; implant aperture; selectively injected; single transverse mode; transverse VCSEL modes; vertical cavity laser; wavelength splitting; Apertures; High speed optical techniques; Implants; Laser modes; Lenses; Optical refraction; Optical variables control; Refractive index; Thermal lensing; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
All-Optical Networking: Existing and Emerging Architecture and Applications/Dynamic Enablers of Next-Generation Optical Communications Systems/Fast Optical Processing in Optical Transmission/VCSEL and
ISSN :
1099-4742
Print_ISBN :
0-7803-7378-2
Type :
conf
DOI :
10.1109/LEOSST.2002.1027616
Filename :
1027616
Link To Document :
بازگشت