The influence of the arc voltage in synthetic test circuits

Author

van der Sluis, L. ; Sheng, B.L.

Author_Institution

Power Syst. Lab., Delft Univ. of Technol., Netherlands

fYear

1994

fDate

10-15 Apr 1994

Firstpage

143

Lastpage

148

Abstract

In this paper, different arc voltage waveforms and KEMA arc models are used to study the stress of the direct SLF ( short line fault) test circuit and the synthetic SLF test circuit on the TB (test breaker). For the synthetic test circuit the total arc energy input in the TB is less than in the direct test circuit, but just before the current zero, the dI/dt and subsequently the arc energy input in the TB is higher. It is demonstrated that the arc-circuit interaction plays an important role for the TB to clear the fault. For SF₆ circuit breakers with an arc voltage of significant extinguishing peak, the voltage injection synthetic test circuit produces an overstress for the TB

Keywords

arcs (electric); circuit breakers; circuit-breaking arcs; high-voltage techniques; switchgear testing; KEMA arc models; SF₆ circuit breakers; arc voltage; arc voltage waveforms; short line fault test circuit; synthetic test circuits; total arc energy input; voltage injection synthetic test circuit; Circuit breakers; Circuit faults; Circuit testing; Laboratories; Power system faults; Power system modeling; Short circuit currents; Stress; System testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Transmission and Distribution Conference, 1994., Proceedings of the 1994 IEEE Power Engineering Society

Conference_Location

Chicago, IL

Print_ISBN

0-7803-1883-8

Type

conf

DOI

10.1109/TDC.1994.328373

Filename

328373