Study on V-t characteristics for XLPE cable

Author

Suzuki, T. ; Kishi, K. ; Uozumi, T. ; Yatsuka, K. ; Yasuda, N. ; Fukui, T.

Author_Institution

Tokyo Electr. Power Co. Inc., Japan

fYear

1994

fDate

10-15 Apr 1994

Firstpage

192

Lastpage

199

Abstract

This paper discusses a study on voltage-life characteristics (V-t characteristics) for XLPE power cables. In order to verify the validity of the lifetime estimates produced by V-t tests, the authors have proposed and evaluated a new V-t testing method in which new techniques of electric degradation luminescence and partial discharge detection methods are applied. As a result, it was found that the evaluation of long-term power cable performance by such V-t tests is justified

Keywords

cable insulation; cable testing; electric breakdown of solids; insulation testing; life testing; luminescence of organic solids; organic insulating materials; partial discharges; power cables; 275 kV; 500 kV; V-t characteristics; XLPE power cables; electric degradation luminescence; lifetime estimation; long-term performance; partial discharge detection; testing method; voltage-life characteristics; Degradation; Impurities; Life testing; Luminescence; Manufacturing processes; Materials testing; Partial discharges; Power cables; Stress; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Transmission and Distribution Conference, 1994., Proceedings of the 1994 IEEE Power Engineering Society

Conference_Location

Chicago, IL

Print_ISBN

0-7803-1883-8

Type

conf

DOI

10.1109/TDC.1994.328381

Filename

328381