• DocumentCode
    2152323
  • Title

    De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB -examinations in one-port measurements-

  • Author

    Maeda, Kumiko ; Iokibe, Kengo ; Toyota, Yoshitaka ; Koga, R.

  • Author_Institution
    Grad. Sch. of Natural Sci. & Technol., Okayama Univ., Okayama, Japan
  • fYear
    2009
  • fDate
    16-20 Sept. 2009
  • Firstpage
    246
  • Lastpage
    249
  • Abstract
    In this paper, the authors evaluate T-matrix extraction method. The method is de-embedding DUT by T-matrix from actual measurement comprising both the parasitics and DUT. The proposed method were more accurate than that by the port-extension function. Result for different trace pattern gave similar results for RC series circuit up to 2 GHz. The calculated MSL parameter also gave consistent result for the RC series circuit up to 2 GHz. It was, however, found that an enough accurate calculation model is necessary to assure a reliable result.
  • Keywords
    S-parameters; integrated circuits; printed circuits; PCB; RC series circuit; S-parameter measurements; T-matrix extraction; T-parameters; board parasitics de-embedding; de-embedding DUT; integrated circuits; port extension function; Circuit testing; Distributed parameter circuits; Electrical resistance measurement; Electromagnetic compatibility; Impedance; Integrated circuit measurements; Microstrip; Power transmission lines; Scattering parameters; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on
  • Conference_Location
    Xian
  • Print_ISBN
    978-1-4244-4344-4
  • Type

    conf

  • DOI
    10.1109/CEEM.2009.5303985
  • Filename
    5303985