Title :
2002 Conference on Optoelectronic and Microelectronic Materials and Devices. COMMAD 2002. Proceedings (Cat. No.02EX601)
Keywords :
integrated circuits; optoelectronic devices; semiconductor device measurement; semiconductor device models; semiconductor device testing; semiconductor junctions; semiconductor lasers; semiconductor materials; microelectronic devices; microelectronic materials; optoelectronic devices; optoelectronic materials; semiconductor characterisation; semiconductor device design; semiconductor device fabrication; semiconductor device measurement; semiconductor device testing; semiconductor growth; semiconductor integrated circuits; semiconductor junctions; semiconductor lasers; semiconductor properties;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-7571-8
DOI :
10.1109/COMMAD.2002.1237175
