• DocumentCode
    2153036
  • Title

    Design of a reliable cache based on grouped checking and data reloading

  • Author

    Wang, Danghui ; Xin, MingRui

  • Author_Institution
    Department of Computer Science and Technology, Northwestern Polytechnical University line, Xi´´an, China
  • fYear
    2010
  • fDate
    4-6 Dec. 2010
  • Firstpage
    5051
  • Lastpage
    5054
  • Abstract
    Reviewing some past research[1–4], we have come to believe that SEU (single event upset) is the main reason for fault or even failure of satellite-borne computer. This paper proposes a reliable cache structure which is based on grouped checking and data reloading. In this structure, data and tag domain are divided into several groups to check. If there have some errors during checking, the cache accessing is identified to cache missing and to reload the right data from memory. The experimental results show preliminarily that the Longteng-FT1 microprocessor we designed is reliable and can tolerate SEU up to 300 Krads (Si).
  • Keywords
    Computers; Physics; Random access memory; Reliability engineering; Satellites; Single event upset; Technical Activities Guide - TAG; Cache; Data relaoding; Grouped checking; microprocessor chips; radiation hazards; reliablity; single event upset (SEU);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Science and Engineering (ICISE), 2010 2nd International Conference on
  • Conference_Location
    Hangzhou, China
  • Print_ISBN
    978-1-4244-7616-9
  • Type

    conf

  • DOI
    10.1109/ICISE.2010.5691449
  • Filename
    5691449