Title :
Design of a reliable cache based on grouped checking and data reloading
Author :
Wang, Danghui ; Xin, MingRui
Author_Institution :
Department of Computer Science and Technology, Northwestern Polytechnical University line, Xi´´an, China
Abstract :
Reviewing some past research[1–4], we have come to believe that SEU (single event upset) is the main reason for fault or even failure of satellite-borne computer. This paper proposes a reliable cache structure which is based on grouped checking and data reloading. In this structure, data and tag domain are divided into several groups to check. If there have some errors during checking, the cache accessing is identified to cache missing and to reload the right data from memory. The experimental results show preliminarily that the Longteng-FT1 microprocessor we designed is reliable and can tolerate SEU up to 300 Krads (Si).
Keywords :
Computers; Physics; Random access memory; Reliability engineering; Satellites; Single event upset; Technical Activities Guide - TAG; Cache; Data relaoding; Grouped checking; microprocessor chips; radiation hazards; reliablity; single event upset (SEU);
Conference_Titel :
Information Science and Engineering (ICISE), 2010 2nd International Conference on
Conference_Location :
Hangzhou, China
Print_ISBN :
978-1-4244-7616-9
DOI :
10.1109/ICISE.2010.5691449