DocumentCode
2153036
Title
Design of a reliable cache based on grouped checking and data reloading
Author
Wang, Danghui ; Xin, MingRui
Author_Institution
Department of Computer Science and Technology, Northwestern Polytechnical University line, Xi´´an, China
fYear
2010
fDate
4-6 Dec. 2010
Firstpage
5051
Lastpage
5054
Abstract
Reviewing some past research[1–4], we have come to believe that SEU (single event upset) is the main reason for fault or even failure of satellite-borne computer. This paper proposes a reliable cache structure which is based on grouped checking and data reloading. In this structure, data and tag domain are divided into several groups to check. If there have some errors during checking, the cache accessing is identified to cache missing and to reload the right data from memory. The experimental results show preliminarily that the Longteng-FT1 microprocessor we designed is reliable and can tolerate SEU up to 300 Krads (Si).
Keywords
Computers; Physics; Random access memory; Reliability engineering; Satellites; Single event upset; Technical Activities Guide - TAG; Cache; Data relaoding; Grouped checking; microprocessor chips; radiation hazards; reliablity; single event upset (SEU);
fLanguage
English
Publisher
ieee
Conference_Titel
Information Science and Engineering (ICISE), 2010 2nd International Conference on
Conference_Location
Hangzhou, China
Print_ISBN
978-1-4244-7616-9
Type
conf
DOI
10.1109/ICISE.2010.5691449
Filename
5691449
Link To Document