• DocumentCode
    2153224
  • Title

    Recent advances in digital-domain background calibration techniques for multistep analog-to-digital converters

  • Author

    Chiu, Yun

  • Author_Institution
    Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    1905
  • Lastpage
    1908
  • Abstract
    An overview of the recent advances in digital-domain linearity enhancement techniques for multistep analog-to-digital converters (ADCs) is presented. Leveraging on increasingly more abundant on-chip processing, a built-in digital adaptability arises as the common denominator underlying most of these approaches. A multitude of the techniques are analyzed in this paper with the associated complexity, limitations, and potentials pointed out. The brief review serves as a stepping-stone for (and entails) more advanced studies in this booming field.
  • Keywords
    analogue-digital conversion; circuit complexity; digital-domain background calibration techniques; digital-domain linearity enhancement techniques; multistep analog-to-digital converters; on-chip processing; Analog-digital conversion; Calibration; Capacitors; Inverters; Linearity; Operational amplifiers; Power amplifiers; Redundancy; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734939
  • Filename
    4734939