DocumentCode :
2153364
Title :
A feature registration framework using mixture models
Author :
Chui, Haili ; Rangarajan, Anand
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
fYear :
2000
fDate :
2000
Firstpage :
190
Lastpage :
197
Abstract :
The authors formulate feature registration problems as maximum likelihood or Bayesian maximum a posteriori estimation problems using mixture models. An EM-like algorithm is proposed to jointly solve for the feature correspondences as well as the geometric transformations. A novel aspect of the authors´ approach is the embedding of the EM algorithm within a deterministic annealing scheme in order to directly control the fuzziness of the correspondences. The resulting algorithm-termed mixture point matching (MPM)-can solve for both rigid and high dimensional (thin-plate spline-based) non-rigid transformations between point sets in the presence of noise and outliers. The authors demonstrate the algorithm´s performance on 2D and 3D data
Keywords :
Bayes methods; feature extraction; image matching; image registration; maximum likelihood estimation; medical image processing; modelling; splines (mathematics); Bayesian maximum a posteriori estimation problems; EM-like algorithm; correspondences fuzziness control; embedded EM algorithm; feature correspondences; feature registration framework; geometric transformations; high dimensional nonrigid transformations; medical diagnostic imaging; mixture models; mixture point matching; rigid transformations; thin-plate spline-based nonrigid transformations; Acoustic noise; Annealing; Bayesian methods; Computed tomography; Computer vision; Electrical capacitance tomography; Maximum a posteriori estimation; Maximum likelihood estimation; Radiology; Spline;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mathematical Methods in Biomedical Image Analysis, 2000. Proceedings. IEEE Workshop on
Conference_Location :
Hilton Head Island, SC
Print_ISBN :
0-7695-0737-9
Type :
conf
DOI :
10.1109/MMBIA.2000.852377
Filename :
852377
Link To Document :
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