Title :
Terahertz surface and interface characterization
Author :
Loffler, T. ; Siebert, Karsten J. ; Hasegawa, Noboru ; Hahn, Tobias ; Loata, Gabriel ; Wipf, Robert ; Kre, Markus ; Thomson, Mark ; Roskos, Hartmut G.
Author_Institution :
Phys. Inst., Johann Wolfgang Goethe-Univ., Frankfurt, Germany
Abstract :
We describe our recent work on various all-optoelectronic imaging systems for the terahertz frequency range and outline their application for surface and interface characterization. Our systems are based either on pulsed or continuous-wave techniques, and they operate both in reflection and transmission geometry. Dark-field techniques are implemented in order to increase the sensitivity to diffraction and scattering effects. Possible application areas of THz imaging in the biomedical field as well as in surface and interface characterization for industrial purposes are explored.
Keywords :
interface roughness; millimetre wave lasers; submillimetre wave imaging; submillimetre waves; THz imaging; THz radiation; all-optoelectronic imaging systems; continuous-wave techniques; dark-field techniques; diffraction; industrial purposes; interface characterization; lasers; pulsed wave technique; reflection; scattering effects; sensitivity; terahertz surface; transmission geometry; Biomedical imaging; Biomedical optical imaging; Detectors; EMP radiation effects; Laser modes; Optical imaging; Optical pulses; Optical refraction; Optical sensors; Surface emitting lasers;
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
Print_ISBN :
0-7803-8845-3
DOI :
10.1109/MWSYM.2005.1516681
