• DocumentCode
    2153713
  • Title

    Backside optical emission diagnostics for excess IDDQ

  • Author

    Kash, J.A. ; Tsang, J.C. ; Rizzolo, Richard F. ; Patel, Atul K. ; Shore, Aaron D.

  • Author_Institution
    Res. Div., IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1997
  • fDate
    5-8 May 1997
  • Firstpage
    23
  • Lastpage
    26
  • Abstract
    Backside optical emission was used to diagnose excess quiescent current in a multi-million gate microprocessor. Emission images showed the current was due to FET´s improperly set in a conducting state. The utility of backside optical emission for IC diagnostics is discussed, and requirements for optical detectors and sample preparation are considered
  • Keywords
    computer testing; integrated circuit testing; microprocessor chips; IC; backside optical emission diagnostics; excess quiescent current; microprocessor; optical detector; sample preparation; CMOS logic circuits; Circuit faults; Circuit testing; FETs; Latches; Logic arrays; Microprocessors; Semiconductor device measurement; Stimulated emission; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-3669-0
  • Type

    conf

  • DOI
    10.1109/CICC.1997.606577
  • Filename
    606577
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2153713