DocumentCode :
2153945
Title :
An electrometric method to measure the mechanical parameters of MEMS devices
Author :
Jiang, LI ; Zhongyu, GAO ; Jingxin, Dong
Author_Institution :
Dept. of Precision Instruments & Mechanology, Tsinghua Univ., Beijing, China
fYear :
2002
fDate :
11-13 Dec. 2002
Firstpage :
221
Lastpage :
224
Abstract :
It is difficult to acquire the actual mechanical parameters of comb-finger MEMS devices, for its sensing element has special structure. In order to derive the parameters, such as the proof mass m, the equivalent distance d0 between fingers, and the mechanical stiffness km, a static electrometric method is investigated. The method includes two experiments, the electrostatic force experiment and the open loop frequency response experiment, and the values of d0, d0, and km can be calculated with the electrical variables in the experiments. The experimental results show that the actual mechanical parameters of the sensing element can be estimated with a high accuracy. It is a convenient and useful method to be used in the fieldwork without the special requirement of environment and costly facilities.
Keywords :
distance measurement; electrometers; mechanical variables measurement; micromechanical devices; MEMS devices; comb-finger MEMS devices; electrical variables; electrometric method; electrostatic force experiment; equivalent distance; mechanical parameters; mechanical parameters of; mechanical stiffness; open loop frequency response experiment; proof mass; sensing element; static electrometric method; Accelerometers; Capacitors; Electrostatics; Fingers; Mechanical variables measurement; Microelectromechanical devices; Micromechanical devices; Microstructure; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on
ISSN :
1097-2137
Print_ISBN :
0-7803-7571-8
Type :
conf
DOI :
10.1109/COMMAD.2002.1237232
Filename :
1237232
Link To Document :
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