• DocumentCode
    2153980
  • Title

    Ultra-wideband, true-time-delay, metamaterial-based microwave lenses

  • Author

    Li, Meng ; Behdad, Nader

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Wisconsin, Madison, WI, USA
  • fYear
    2012
  • fDate
    8-14 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, a new technique for designing low-profile, ultra-wideband, true-time-delay (TTD) microwave lenses is proposed. Such a lens is composed of numerous spatial TTD units distributed over a planar surface. Each spatial TTD unit is the unit cell of an appropriately-designed metamaterial structure, which is composed entirely of non-resonant constituting elements. The proposed TTD lens is a low-profile structure with an overall thickness of only 0.15λ0 and uses spatial TTD units with dimensions of 0.19λ0 × 0:19λ0, where λ0 is the free-space wavelength at the center frequency of operation. Unlike most metamaterial lenses, which tend to be narrow band and highly dispersive, the proposed lens has a wide operational bandwidth of 30% and a high system fidelity factor close to 1. Furthermore, due to its true-time-delay nature, the fabricated lens prototype does not suffer from chromatic aberration within its operational band. When used in a beam-scanning antenna system, the fabricated prototype demonstrates an excellent scanning performance in a field of view of ±60°.
  • Keywords
    delays; lens antennas; metamaterial antennas; microwave materials; scanning antennas; ultra wideband antennas; TTD; beam scanning antenna system; fabricated lens prototype; fidelity factor; free space wavelength; low profile structure; metamaterial-based microwave lens; planar surface; true time delay; ultra wideband lens; Apertures; Lenses; Metamaterials; Microwave theory and techniques; Power measurement; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-0461-0
  • Type

    conf

  • DOI
    10.1109/APS.2012.6349044
  • Filename
    6349044