Title :
Extending the test paradigm beyond the technology dissemination
Author_Institution :
Nat. Networked TeleTest Facility, Edith Cowan Univ., Perth, WA, Australia
Abstract :
The escalating demand for technology integration in and around CMOS devices and the introduction of a large variety of new processes and structures to achieve challenging new product features is yielding new systems with an increasing level of test complexity. This test technique can be easily incorporated in the current digital test techniques using ATE (Automated Test Equipment) and therefore allowing economical large scale production testing of devices combining electrical and optical signals.
Keywords :
CMOS digital integrated circuits; automatic test equipment; integrated circuit testing; integrated circuit yield; semiconductor device models; semiconductor device testing; ATE; CMOS device testing; automated test equipment; combined electrical-and-optical signal; digital test technique; economical large scale production testing; technology integration; test complexity level; Automatic testing; CMOS technology; Circuit faults; Circuit testing; Circuits and systems; Costs; Integrated circuit technology; Power system modeling; Radio frequency; System testing;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
DOI :
10.1109/ICSICT.2008.4734980
