Extending the test paradigm beyond the technology dissemination

Author

Osseiran, Adam

Author_Institution

Nat. Networked TeleTest Facility, Edith Cowan Univ., Perth, WA, Australia

fYear

2008

fDate

20-23 Oct. 2008

Firstpage

2066

Lastpage

2069

Abstract

The escalating demand for technology integration in and around CMOS devices and the introduction of a large variety of new processes and structures to achieve challenging new product features is yielding new systems with an increasing level of test complexity. This test technique can be easily incorporated in the current digital test techniques using ATE (Automated Test Equipment) and therefore allowing economical large scale production testing of devices combining electrical and optical signals.

Keywords

CMOS digital integrated circuits; automatic test equipment; integrated circuit testing; integrated circuit yield; semiconductor device models; semiconductor device testing; ATE; CMOS device testing; automated test equipment; combined electrical-and-optical signal; digital test technique; economical large scale production testing; technology integration; test complexity level; Automatic testing; CMOS technology; Circuit faults; Circuit testing; Circuits and systems; Costs; Integrated circuit technology; Power system modeling; Radio frequency; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on

Conference_Location

Beijing

Print_ISBN

978-1-4244-2185-5

Electronic_ISBN

978-1-4244-2186-2

Type

conf

DOI

10.1109/ICSICT.2008.4734980

Filename

4734980