DocumentCode
2154238
Title
40V MESFETs fabricated on 32nm SOI CMOS
Author
Lepkowski, William ; Wilk, Seth J. ; Kam, Jason ; Thornton, Trevor J.
Author_Institution
Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
fYear
2013
fDate
22-25 Sept. 2013
Firstpage
1
Lastpage
4
Abstract
This article describes 40V N-channel MESFETs fabricated at a commercial 32nm SOI CMOS foundry without changing any of the process flow or including additional mask steps. The 32nm technology node is the most advanced technology node to date for MESFET fabrication and builds upon previous work completed at other process nodes. High voltage MESFETs were measured with current drives of 110mA/mm. The devices are suitable for RF development and have peak cut-off frequency, fT, of 30.5GHz and maximum oscillation frequency, fmax, of 34.5GHz.
Keywords
CMOS integrated circuits; MESFET integrated circuits; foundries; integrated circuit manufacture; silicon-on-insulator; MESFET fabrication; N-channel MESFET; SOI CMOS foundry; oscillation frequency; size 32 nm; voltage 40 V; CMOS integrated circuits; Current measurement; Electric breakdown; Logic gates; MESFETs; Radio frequency; Silicon-on-insulator;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location
San Jose, CA
Type
conf
DOI
10.1109/CICC.2013.6658399
Filename
6658399
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