• DocumentCode
    2154238
  • Title

    40V MESFETs fabricated on 32nm SOI CMOS

  • Author

    Lepkowski, William ; Wilk, Seth J. ; Kam, Jason ; Thornton, Trevor J.

  • Author_Institution
    Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This article describes 40V N-channel MESFETs fabricated at a commercial 32nm SOI CMOS foundry without changing any of the process flow or including additional mask steps. The 32nm technology node is the most advanced technology node to date for MESFET fabrication and builds upon previous work completed at other process nodes. High voltage MESFETs were measured with current drives of 110mA/mm. The devices are suitable for RF development and have peak cut-off frequency, fT, of 30.5GHz and maximum oscillation frequency, fmax, of 34.5GHz.
  • Keywords
    CMOS integrated circuits; MESFET integrated circuits; foundries; integrated circuit manufacture; silicon-on-insulator; MESFET fabrication; N-channel MESFET; SOI CMOS foundry; oscillation frequency; size 32 nm; voltage 40 V; CMOS integrated circuits; Current measurement; Electric breakdown; Logic gates; MESFETs; Radio frequency; Silicon-on-insulator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2013 IEEE
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/CICC.2013.6658399
  • Filename
    6658399