DocumentCode :
2154238
Title :
40V MESFETs fabricated on 32nm SOI CMOS
Author :
Lepkowski, William ; Wilk, Seth J. ; Kam, Jason ; Thornton, Trevor J.
Author_Institution :
Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
fYear :
2013
fDate :
22-25 Sept. 2013
Firstpage :
1
Lastpage :
4
Abstract :
This article describes 40V N-channel MESFETs fabricated at a commercial 32nm SOI CMOS foundry without changing any of the process flow or including additional mask steps. The 32nm technology node is the most advanced technology node to date for MESFET fabrication and builds upon previous work completed at other process nodes. High voltage MESFETs were measured with current drives of 110mA/mm. The devices are suitable for RF development and have peak cut-off frequency, fT, of 30.5GHz and maximum oscillation frequency, fmax, of 34.5GHz.
Keywords :
CMOS integrated circuits; MESFET integrated circuits; foundries; integrated circuit manufacture; silicon-on-insulator; MESFET fabrication; N-channel MESFET; SOI CMOS foundry; oscillation frequency; size 32 nm; voltage 40 V; CMOS integrated circuits; Current measurement; Electric breakdown; Logic gates; MESFETs; Radio frequency; Silicon-on-insulator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/CICC.2013.6658399
Filename :
6658399
Link To Document :
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