DocumentCode
2154298
Title
FPGA interconnect testing algorithm based on routing-resource graph
Author
Dai, Li ; Liu, Zhi-bin ; Liang, Shao-chi ; Yang, Meng ; Wang, Ling-Li
Author_Institution
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
fYear
2008
fDate
20-23 Oct. 2008
Firstpage
2087
Lastpage
2090
Abstract
Static-random-access-memory(SRAM)-based field programmable gate arrays (FPGAs) consists of 50% ~70% routing resources. A simple programmable interconnect point (PIP) is a switch controlled by SRAM configuration cell connecting two wires. A novel traverse algorithm targeted for the detection of PIP open faults is proposed. Experimental results run on the Fudan design system (FDS) platform show that the algorithm is effective to examine the open faults of the routing paths caused by the PIPs fault configuration.
Keywords
SRAM chips; field programmable gate arrays; interconnections; network routing; FPGA interconnect testing algorithm; Fudan design system; PIPs fault configuration; SRAM configuration cell; open faults; routing-resource graph; static-random-access-memory; Circuit faults; Field programmable gate arrays; Integrated circuit interconnections; Logic; Random access memory; Routing; Switches; Testing; Wire; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-2185-5
Electronic_ISBN
978-1-4244-2186-2
Type
conf
DOI
10.1109/ICSICT.2008.4734988
Filename
4734988
Link To Document