• DocumentCode
    2154298
  • Title

    FPGA interconnect testing algorithm based on routing-resource graph

  • Author

    Dai, Li ; Liu, Zhi-bin ; Liang, Shao-chi ; Yang, Meng ; Wang, Ling-Li

  • Author_Institution
    State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    2087
  • Lastpage
    2090
  • Abstract
    Static-random-access-memory(SRAM)-based field programmable gate arrays (FPGAs) consists of 50% ~70% routing resources. A simple programmable interconnect point (PIP) is a switch controlled by SRAM configuration cell connecting two wires. A novel traverse algorithm targeted for the detection of PIP open faults is proposed. Experimental results run on the Fudan design system (FDS) platform show that the algorithm is effective to examine the open faults of the routing paths caused by the PIPs fault configuration.
  • Keywords
    SRAM chips; field programmable gate arrays; interconnections; network routing; FPGA interconnect testing algorithm; Fudan design system; PIPs fault configuration; SRAM configuration cell; open faults; routing-resource graph; static-random-access-memory; Circuit faults; Field programmable gate arrays; Integrated circuit interconnections; Logic; Random access memory; Routing; Switches; Testing; Wire; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734988
  • Filename
    4734988