Title :
FPGA interconnect testing algorithm based on routing-resource graph
Author :
Dai, Li ; Liu, Zhi-bin ; Liang, Shao-chi ; Yang, Meng ; Wang, Ling-Li
Author_Institution :
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
Abstract :
Static-random-access-memory(SRAM)-based field programmable gate arrays (FPGAs) consists of 50% ~70% routing resources. A simple programmable interconnect point (PIP) is a switch controlled by SRAM configuration cell connecting two wires. A novel traverse algorithm targeted for the detection of PIP open faults is proposed. Experimental results run on the Fudan design system (FDS) platform show that the algorithm is effective to examine the open faults of the routing paths caused by the PIPs fault configuration.
Keywords :
SRAM chips; field programmable gate arrays; interconnections; network routing; FPGA interconnect testing algorithm; Fudan design system; PIPs fault configuration; SRAM configuration cell; open faults; routing-resource graph; static-random-access-memory; Circuit faults; Field programmable gate arrays; Integrated circuit interconnections; Logic; Random access memory; Routing; Switches; Testing; Wire; Wiring;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
DOI :
10.1109/ICSICT.2008.4734988