A BIST scheme for full characterization of ADC parameters in Mixed-Signal SoCs

A BIST scheme that can both characterize the dynamic and static parameters of ADCs in Mixed-Signal SoCs are proposed in this paper. This approach can be implemented almost all digitally except for a few simple analog filters. Analog stimulus for both the dynamic and static test are encoded and stored in on-chip RAM or ROM and retrieved when the corresponding test starts. Elemental operative units and memories for response analysis can be reused to reduce hardware consumption. The proposed scheme unifies the stimulus generation mechanism and reuses the resource for response analysis thus can be implemented with reasonable area overhead.