Title :
Interconnect and package design of a heterogeneous stacked-silicon FPGA
Author :
Wu, E. ; Abugharbieh, Khaldoon ; Banijamali, Bahareh ; Ramalingam, S. ; Wu, Po-Han ; Wyland, Chris
Author_Institution :
Xilinx, Inc., San Jose, CA, USA
Abstract :
This paper reviews the interconnect and package design of a heterogeneous stacked-silicon FPGA. Up to five dice from two die types are mounted on a passive silicon interposer. A hardware- and software-scalable FPGA family can be created by mixing different combinations of these two die types. The FPGA, inside a low-temperature co-fired ceramic (LTCC) package, consists of two silicon die types - up to three FPGA ICs having a total of seventy-two 13.1-Gb/s transceivers (943.2 Gb/s full-duplex) and up to two GTZ ICs having up to sixteen 28.05-Gb/s transceivers (448.8 Gb/s full-duplex). Two types of interconnects are discussed: those joining the ICs through wires in the silicon interposer, and those connecting the 28-Gb/s transceivers through TSVs in the interposer to the package balls. An end-to-end 28.05-Gb/s channel simulation is discussed in the context of silicon interposer resistivity as well as package material and stack-up. In addition, this paper reviews 3D thermal-mechanical analysis confirming the reliability of heterogeneous stacked silicon.
Keywords :
ceramic packaging; elemental semiconductors; field programmable gate arrays; integrated circuit interconnections; logic design; silicon; 3D thermal-mechanical analysis; FPGA IC; LTCC package; Si; TSV; bit rate 13.1 Gbit/s; bit rate 28.05 Gbit/s; bit rate 448.8 Gbit/s; bit rate 943.2 Gbit/s; end-to-end channel simulation; hardware-scalable FPGA family; heterogeneous stacked-silicon FPGA; interconnect design; low-temperature co-fired ceramic package; package balls; package design; package material; passive silicon interposer; silicon die types; silicon interposer resistivity; software-scalable FPGA family; transceivers; Field programmable gate arrays; Integrated optics; Silicon; Substrates; Transceivers; Wires;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA
DOI :
10.1109/CICC.2013.6658402