• DocumentCode
    2154684
  • Title

    Flip-chip for space applications : Bonding reliability, DC and RF results

  • Author

    George, Sébastien ; Drevon, Claude ; Cazaux, Jean-Louis

  • Author_Institution
    ALCATEL SPACE INDUSTRIES - BP1187 - 31037 TOULOUSE Cedexl - France. sebastien.george@space.alcatel.fr
  • fYear
    2000
  • fDate
    Oct. 2000
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a study of flip-chip bonding for space applications. DC and mechanical test vehicles have demonstrated the reliability of the flip-chip gold-gold thermocompression bonding up to 500 thermal cycles. RF test vehicles have proved the compatibility of both coplanar and microstrip on-the-shelves MMICs with the flip-chip bonding up to 35 GHz.
  • Keywords
    Bonding; Contact resistance; Electrical resistance measurement; Gold; MMICs; Microstrip; Radio frequency; Substrates; Testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2000. 30th European
  • Conference_Location
    Paris, France
  • Type

    conf

  • DOI
    10.1109/EUMA.2000.338745
  • Filename
    4139758