DocumentCode :
2154959
Title :
Performance of InGaP/InGaAs/GaAs camel-gate single δ-doping pHEMT
Author :
Tsai, Jung-Hui
Author_Institution :
Dept. of Phys., Nat. Kaohsiung Normal Univ., Taiwan
fYear :
2002
fDate :
11-13 Dec. 2002
Firstpage :
369
Lastpage :
372
Abstract :
A newly designed single delta-doped InGaP/InGaAs/GaAs pseudomorphic HEMT with n+-GaAs/p+-InGaP/n-InGaP camel gate structure has been first fabricated and demonstrated. For a 1×100 μm2 device, the experimental results show an extrinsic transconductance of 85 mS/mm and a saturation current density of 425 mA/mm. Significantly, due to the p-n depletion from p+-InGaP gate to channel region and the presence of ΔEc at InGaP/InGaAs heterostructure, the turn-on voltage of gate is larger than 1.7 V. In addition, an extremely broad gate voltage swing larger than 3 V with above 80% maximum gm is obtained. The unit current cutoff frequency fT and maximum oscillation frequency fmax are up to 18 and 30 GHz, respectively.
Keywords :
III-V semiconductors; current density; electric admittance; gallium compounds; high electron mobility transistors; indium compounds; nanotechnology; p-n junctions; semiconductor heterojunctions; 18 GHz; 30 GHz; +-GaAs/p+-InGaP/n-InGaP camel gate structure; InGaP-InGaAs-GaAs; InGaP/InGaAs heterostructure; InGaP/InGaAs/GaAs pseudomorphic HEMT; broad gate voltage swing; extrinsic transconductance; oscillation frequency; p-n depletion; p+-InGaP gate; saturation current density; turn-on voltage; Cutoff frequency; Doping; FETs; Gallium arsenide; HEMTs; Indium gallium arsenide; MESFETs; PHEMTs; Transconductance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on
ISSN :
1097-2137
Print_ISBN :
0-7803-7571-8
Type :
conf
DOI :
10.1109/COMMAD.2002.1237267
Filename :
1237267
Link To Document :
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