DocumentCode :
2155162
Title :
Self-calibration of digital phase-locked loops
Author :
Veillette, Benoît R. ; Roberts, Gordon W.
Author_Institution :
Microelectron & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
fYear :
1997
fDate :
5-8 May 1997
Firstpage :
49
Lastpage :
52
Abstract :
A novel method for the measurement of the jitter transfer function of digital phase-locked loops is presented. The signal generation and analysis circuits are entirely digital except for an extra charge-pump. They hence do not require calibration. Contrary to other phase-locked loop digital measurement schemes, a clock frequency larger than the phase-locked loop operating frequency is not necessary. Because the area overhead is small, our scheme is highly amenable to on-chip tuning of analog components for compliance to specifications. This method could also be used to implement built-in self-test for phase-locked loops. Experiments with discrete components show the jitter transfer function measuring method is sound
Keywords :
built-in self test; calibration; circuit tuning; clocks; digital phase locked loops; jitter; transfer functions; area overhead; built-in self-test; clock frequency; digital phase-locked loops; jitter transfer function; on-chip tuning; self-calibration; signal generation; Calibration; Charge pumps; Circuit analysis; Frequency measurement; Jitter; Phase locked loops; Phase measurement; Signal analysis; Signal generators; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3669-0
Type :
conf
DOI :
10.1109/CICC.1997.606583
Filename :
606583
Link To Document :
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