Title :
Distributed effects in high power RF LDMOS transistors
Author :
Goverdhanam, Kavita ; Dai, Wenhua ; Frei, Michel ; Farrell, Don ; Bude, Jeff ; Safar, Hugo ; Mastrapasqua, M. ; Bambridge, Tim
Author_Institution :
Agere Syst., Allentown, PA, USA
Abstract :
This paper focuses on the effects of distributed RF transmission lines on performance aspects, such as, gain, output power, efficiency etc. in high power RF LDMOS amplifiers. The methodology to model and capture the distributed effects is discussed. Suitable alternatives to mitigate power loss due to distributive effects in large transistors are presented. Also, the contributions of the package to the overall device performance are addressed.
Keywords :
MMIC amplifiers; power MOSFET; semiconductor device models; transmission lines; RF LDMOS amplifiers; device performance; distributed RF transmission lines; distributed effects; high power RF LDMOS transistors; large transistors; power loss mitigation; Loss measurement; Packaging; Power amplifiers; Power generation; Power measurement; Radio frequency; Radiofrequency amplifiers; Rails; Topology; Voltage;
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
Print_ISBN :
0-7803-8845-3
DOI :
10.1109/MWSYM.2005.1516744