DocumentCode :
2155208
Title :
The short-circuit current and open-circuit voltage of moisture absorbed polyimide thin films with different electrode materials
Author :
Muramoto, Yuji ; Mizuno, Yukio ; Nagao, Masayuki ; Kosaki, Masamitsu
Author_Institution :
Dept. of Electr. & Electron. Eng., Toyohashi Univ. of Technol., Japan
Volume :
1
fYear :
1994
fDate :
3-8 Jul 1994
Firstpage :
219
Abstract :
This paper describes the short-circuit current and open-circuit voltage of moisture absorbed polyimide thin films with different electrode materials. Relative humidity dependences of their short-circuit current and open-circuit voltage in the room temperature were measured and their mechanism was discussed. The short-circuit current and open-circuit voltage increased with relative humidity. It is suggested that the short-circuit current flows due to an electromotive force, possibly associated with an oxidation-reduction reaction at electrode metals. Since the electrical conduction of moisture absorbed polyimide may be ionic, Au-Polyimide-Al system forms a galvanic cell and electromotive force is generated by the chemical reaction at the metal-polyimide interface. Furthermore, since the conduction current under an external field and the short-circuit current have similar relative humidity dependence, it shows that in moisture absorbed polyimide thin films ion an generation may be promoted, which leads to ionic conduction. It is suggested from the open-circuit voltage that the voltage characteristics are affected by a distribution of internal carriers in sample
Keywords :
Current measurement; Electrodes; Galvanizing; Humidity measurement; Moisture; Polyimides; Temperature dependence; Temperature measurement; Transistors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-7803-1307-0
Type :
conf
DOI :
10.1109/ICPADM.1994.413978
Filename :
413978
Link To Document :
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