DocumentCode :
2155266
Title :
Efficient frequency-dependent reluctance extraction for large-scale Power/Ground grid
Author :
Zeng, Shan ; Yu, Wenjian ; Gong, Fang ; Hong, Xianlong ; Shi, Jin ; Wang, Zeyi ; Cheng, Chung-Kuan
Author_Institution :
Dept. of Comput. Sci. &Tech, Tsinghua Univ., Beijing, China
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
2292
Lastpage :
2295
Abstract :
Inductive effect becomes important for on-chip global interconnects, like Power/Ground (P/G) grid. Partial reluctance (the inverse of partial inductance) has been accepted to model inductive effect, for its local property. In this paper, a new method which makes full use of the structure regularity of P/G grid is proposed. With a reuse scheme and carefully handling of boundary effect, the proposed method exhibits high speed and high accuracy. Numerical results demonstrate the proposed method can handle large-scale P/G grid with high accuracy and is at least several times faster than existing methods.
Keywords :
VLSI; integrated circuit interconnections; VLSI circuits; boundary effect; frequency-dependent reluctance extraction; inductive effect; large-scale Power/Ground grid; on-chip global interconnects; Capacitance; Circuit simulation; Computer science; Conductors; Coupling circuits; Frequency; Inductance; Integrated circuit interconnections; Large-scale systems; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4735028
Filename :
4735028
Link To Document :
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