• DocumentCode
    2155266
  • Title

    Efficient frequency-dependent reluctance extraction for large-scale Power/Ground grid

  • Author

    Zeng, Shan ; Yu, Wenjian ; Gong, Fang ; Hong, Xianlong ; Shi, Jin ; Wang, Zeyi ; Cheng, Chung-Kuan

  • Author_Institution
    Dept. of Comput. Sci. &Tech, Tsinghua Univ., Beijing, China
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    2292
  • Lastpage
    2295
  • Abstract
    Inductive effect becomes important for on-chip global interconnects, like Power/Ground (P/G) grid. Partial reluctance (the inverse of partial inductance) has been accepted to model inductive effect, for its local property. In this paper, a new method which makes full use of the structure regularity of P/G grid is proposed. With a reuse scheme and carefully handling of boundary effect, the proposed method exhibits high speed and high accuracy. Numerical results demonstrate the proposed method can handle large-scale P/G grid with high accuracy and is at least several times faster than existing methods.
  • Keywords
    VLSI; integrated circuit interconnections; VLSI circuits; boundary effect; frequency-dependent reluctance extraction; inductive effect; large-scale Power/Ground grid; on-chip global interconnects; Capacitance; Circuit simulation; Computer science; Conductors; Coupling circuits; Frequency; Inductance; Integrated circuit interconnections; Large-scale systems; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4735028
  • Filename
    4735028