• DocumentCode
    2155363
  • Title

    Reflection Photoelastic Tomography for the Detection of Axial Stress Distribution in Planar Optical Waveguides

  • Author

    Ferrario, Maddalena ; Licciardello, Alberto ; Pietralunga, Silvia M. ; Martinelli, Mario

  • Author_Institution
    CoreCom, Milan
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    In this paper a novel scheme of photoelastic tomography is described, to be applied to planar waveguides. It exploits the reflection of the laser probe beam at the waveguide-substrate interface to reconstruct stress distributions in waveguide cross sections. By this technique, spurious or induced local stress variations in integrated optics components can also be brought into evidence.
  • Keywords
    optical planar waveguides; optical testing; optical tomography; photoelasticity; stress measurement; axial stress distribution; laser probe beam; planar optical waveguides; reflection photoelastic tomography; waveguide substrate interface; Laser beams; Optical planar waveguides; Optical reflection; Optical waveguides; Photoelasticity; Planar waveguides; Probes; Stress; Tomography; Waveguide lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-0931-0
  • Electronic_ISBN
    978-1-4244-0931-0
  • Type

    conf

  • DOI
    10.1109/CLEOE-IQEC.2007.4386164
  • Filename
    4386164
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2155363