• DocumentCode
    2155372
  • Title

    A novel IP quality evaluation method based on IP function

  • Author

    Lian, Yongyi ; Chen, Lan ; Su, Yajuan

  • Author_Institution
    Dept. of Common Technol., Inst. of Microelectron., Beijing, China
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    2304
  • Lastpage
    2308
  • Abstract
    A novel IP quality evaluation method is proposed in this paper. Based on the analysis of the characteristics of several current mainstream IP quality evaluation metrics, advantages and deficiencies of them are summarized. The comparison indicates that due to coarse grain of classification and focusing more on common features, the definition methods of these metrics are lack of individual characteristics representation, especially the functional part. By analyzing the features of different kinds of IPs, a third party IP quality evaluation metric based on IP design flow and IP functional classification is addressed. Furthermore, the classification method as well as its feasibility is explained in detail. Finally, IP quality evaluation procedure of a specific soft embedded processor IP core is presented based on the proposed method.
  • Keywords
    industrial property; IP functional classification; IP quality evaluation method; intellectual property; Ecosystems; Electronic design automation and methodology; Integrated circuit reliability; Intellectual property; Microelectronics; Process design; Production; Risk management; Standards organizations; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4735032
  • Filename
    4735032