DocumentCode
2155372
Title
A novel IP quality evaluation method based on IP function
Author
Lian, Yongyi ; Chen, Lan ; Su, Yajuan
Author_Institution
Dept. of Common Technol., Inst. of Microelectron., Beijing, China
fYear
2008
fDate
20-23 Oct. 2008
Firstpage
2304
Lastpage
2308
Abstract
A novel IP quality evaluation method is proposed in this paper. Based on the analysis of the characteristics of several current mainstream IP quality evaluation metrics, advantages and deficiencies of them are summarized. The comparison indicates that due to coarse grain of classification and focusing more on common features, the definition methods of these metrics are lack of individual characteristics representation, especially the functional part. By analyzing the features of different kinds of IPs, a third party IP quality evaluation metric based on IP design flow and IP functional classification is addressed. Furthermore, the classification method as well as its feasibility is explained in detail. Finally, IP quality evaluation procedure of a specific soft embedded processor IP core is presented based on the proposed method.
Keywords
industrial property; IP functional classification; IP quality evaluation method; intellectual property; Ecosystems; Electronic design automation and methodology; Integrated circuit reliability; Intellectual property; Microelectronics; Process design; Production; Risk management; Standards organizations; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-2185-5
Electronic_ISBN
978-1-4244-2186-2
Type
conf
DOI
10.1109/ICSICT.2008.4735032
Filename
4735032
Link To Document