Title :
Tail-Bit Tracking circuit with degraded VGS bit-cell mimic array for a 50% search-time and 200mV Vmin improvement in a Ternary Content Addressable Memory
Author :
Arsovski, I. ; Hebig, Travis ; Goss, James ; Grzymkowski, Paul ; Patch, Josh
Author_Institution :
IBM Syst. & Technol. Group, Essex Junction, VT, USA
Abstract :
A memory sense-amplifier timing circuit emulates the behavior of weak memory tail-bits to improve Tail-Bit Tracking (TBT) across Process, Voltage and Temperature. The TBT circuit is used to generate timing for a search operation in a 32nm Ternary Content Addressable Memory (TCAM) compiler resulting in 200mV Vmin improvement at a constant performance, and 50% improved search-time performance at a constant Vmin. This TBT circuit was implemented in 32nm High-K Metal Gate SOI process to achieve 0.60V operation and support up to 1G search/sec throughput on a 2048×640bit TCAM instance.
Keywords :
amplifiers; content-addressable storage; high-k dielectric thin films; silicon-on-insulator; timing circuits; TCAM compiler; high-K metal gate SOI process; search-time performance; size 32 nm; voltage 0.60 V; voltage 200 mV; Arrays; Capacitors; Delays; Hardware; High K dielectric materials; MIMICs;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA
DOI :
10.1109/CICC.2013.6658454