Title :
A Tool To Analyze The Response of EMC Chambers
Author :
Vielva, Carlos Manuel ; Basterrechea, José
Author_Institution :
Dpto. IngenierÃ\xada de Comunicaciones. ETSIIT. Universidad de Cantabria, Avda. Los Castros s/n. 39005. Santander. Cantabria. SPAIN
Abstract :
A method for the analysis of anechoic and semianechoic chambers in the low frequency range is presented in this work. The method combines homogeneization with geometrical optics to account for multiple reflections in absorber lined chambers. Image theory is used to speed up the computation. The method is able to deal with different kind of absorbers (multilayer, pyramidal, hybrid) with their geometrical dimensions and shape stating the upper frequency limit of validity of the approach. Both dielectric and magnetic lossy materials are considered. The method has been implemented in a software tool with a GUI and allows the user an easy introduction of geometrical data for both the screening and the absorbers.
Keywords :
Dielectric losses; Dielectric materials; Electromagnetic compatibility; Frequency; Geometrical optics; Magnetic losses; Magnetic materials; Magnetic multilayers; Optical reflection; Shape;
Conference_Titel :
Microwave Conference, 2000. 30th European
Conference_Location :
Paris, France
DOI :
10.1109/EUMA.2000.338792