DocumentCode :
2156116
Title :
Electrochemically etched pore array in silicon with large spacing and high-aspect-ratio
Author :
Qi, Rui ; Yue, Ruifeng
Author_Institution :
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
2424
Lastpage :
2427
Abstract :
Based on electrochemical etching with illumination from backside, we present a novel fabrication technique which can produce pore array in silicon with large pore spacing and high-aspect-ratio, and the regularly distributed pore array with both spacing and depth of up to several hundred micrometers can be achieved. The difficulties have been investigated according to the mechanism of macroporous silicon formation, and the primary design guidelines of the mask and the processing environment are given.
Keywords :
elemental semiconductors; etching; integrated circuit design; masks; porous semiconductors; silicon; Si; electrochemical etching; electrochemically etched pore array; fabrication technique; high-aspect-ratio; illumination; large pore spacing; macroporous silicon formation; mask; Anisotropic magnetoresistance; Costs; Fabrication; Information science; Laboratories; Lighting; Semiconductor device modeling; Silicon; Thyristors; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4735060
Filename :
4735060
Link To Document :
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