Epitaxial growth of Yb-doped YAG and YbAG PLD-films monitored in situ by Reflection High Energy Electron Diffraction

Author

Gün, T. ; Kuzminykh, Y. ; Petermann, K. ; Scheife, H. ; Huber, G.

Author_Institution

Univ. Hamburg, Hamburg

fYear

2007

fDate

17-22 June 2007

Firstpage

1

Lastpage

1

Abstract

This study reports on the 2-dimensional growth of Yb:YAG and YbAG pulsed laser deposited (PLD)-films on YAG, which is monitored by RHEED measurements in situ during growth. The properties of the films after growth are investigated by means of XRD, AFM and optical spectroscopy. Films highly textured in the orientation defined by the substrate are obtained.

Keywords

X-ray diffraction; atomic force microscopy; epitaxial growth; photoluminescence; pulsed laser deposition; reflection high energy electron diffraction; thin films; ytterbium; AFM; RHEED measurements; XRD; YAG:Yb; Yb-doped YAG films; Yb₃Al₅O₁₂; YbAG films; emission cross-section spectra; epitaxial growth; optical spectroscopy; pulsed laser deposition; Electrons; Epitaxial growth; Monitoring; Optical diffraction; Optical films; Optical pulses; Optical reflection; Pulse measurements; Pulsed laser deposition; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on

Conference_Location

Munich

Print_ISBN

978-1-4244-0931-0

Electronic_ISBN

978-1-4244-0931-0

Type

conf

DOI

10.1109/CLEOE-IQEC.2007.4386205

Filename

4386205