DocumentCode
2156838
Title
Detection of stiction of suspending structures in MEMS by A Laser Doppler Vibrometer systems
Author
Liu, Jun-Wen ; Huang, Qing-An ; Song, Jing ; Tang, Jie-ying
Author_Institution
Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing, China
fYear
2008
fDate
20-23 Oct. 2008
Firstpage
2472
Lastpage
2475
Abstract
Stiction as one of the most failures both in MEMS fabrication and operation has been widely studied. With the decrease in the dimension and material, the ubiquitous surface effect between the device and substrate has become more and more effective. Surface-micromachined structures formed by the wet etching of sacrificial layers are commonly plagued by problems of sticking to the substrate. This paper presents a useful diagnosis system for fully detecting and characterizing the stiction failure occurring in MEMS. The system consists of an LDV (laser Doppler vibrometer), a chamber with controllable environment such as pressure and temperature, and a diagnosis program developed by Matlab software. Full knowledge about the stiction, including its position, shape, stiction releasing configuration and probability of re-stiction can be accessed using the system. We also present an experimental way to analyze two important forces of the surface effect: the capillary force and the van der Waals force. The experimental diagnosis methodology and theoretical summary could provide a useful reference for detecting and predicting the stiction failure of micro-structures.
Keywords
Doppler measurement; laser velocimetry; mathematics computing; micromachining; microsensors; stiction; vibrations; MEMS; Matlab software; capillary force; diagnosis system; laser Doppler vibrometer; micro-structures; stiction failure; surface micromachining; suspending structures; van der Waals force; Control systems; Micromechanical devices; Optical control; Optical device fabrication; Optical materials; Pressure control; Shape; Temperature control; Vibrometers; Wet etching; Laser Doppler Vibrometer; stiction; surface force;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-2185-5
Electronic_ISBN
978-1-4244-2186-2
Type
conf
DOI
10.1109/ICSICT.2008.4735092
Filename
4735092
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