Title :
Frequency-differential representation of losses to express quality factor in terms of reactance-slope parameters for three-dimensional, arbitrarily-shaped resonators
Author :
Spielman, Barry E.
Author_Institution :
Dept. of Electr. & Syst. Eng., Washington Univ., St. Louis, MO, USA
Abstract :
The use of reactance slope parameters for the design of RF and microwave filters was drawn from lumped-element circuit representations. In recent work, a field-theoretic framework was established to represent the quality factor in terms of reactance-slope parameters for electrically-large, arbitrarily-shaped, three dimensional resonators. The work presented in this paper develops a relationship for use in the denominator of the field-theoretic representation for modal Q that involves strictly surface-based field and source quantities, even for losses distributed throughout the resonator volume. By doing so the field-theoretic representation for Q becomes a strictly surface field and source dependent representation with the attendant reduced level of dimensionality (two-dimensional instead of three-dimensional integrals) and with a potentially corresponding reduction in computational complexity. The relationships presented here are used to evaluate the effect of dielectric losses on the unloaded Q for TE101-mode rectangular resonators comprised of silver, copper, aluminum, and brass and are used to compare unloaded Q values for air- and fused-quartz-filled resonators. Results are also presented for circular cylindrical resonators comprised of the same lossy metals and lossy dielectrics.
Keywords :
Q-factor; dielectric losses; dielectric resonators; 3D arbitrarily-shaped resonators; RF filters; TE101-mode rectangular resonators; circular cylindrical resonators; conductor losses; dielectric losses; electrically-large resonators; electromagnetic fields; frequency-differential representation; lossy dielectrics; lossy metals; lumped-element circuit representations; microwave filters; microwave resonators; quality factor; reactance slope parameters; reactance-slope parameters; source quantities; surface-based field; Computational complexity; Copper; Dielectric losses; Microwave circuits; Microwave filters; Q factor; Radio frequency; Resonator filters; Silver; Tellurium;
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
Print_ISBN :
0-7803-8845-3
DOI :
10.1109/MWSYM.2005.1516851