• DocumentCode
    2157266
  • Title

    Advanced digital phase-locked loops

  • Author

    Levantino, Salvatore

  • Author_Institution
    Politec. di Milano, Milan, Italy
  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    95
  • Abstract
    Analog PLLs do not scale down as process and are not amenable to noise-cancellation and other calibration algorithms; Digital PLLs exploit CMOS scaling and allow for simple, accurate implementation of digiphase and two-point modulation; Typically, DPLLs require TDCs with tight resolution to achieve low phase noise and fractional-spur level, which increase both power consumption and design effort; DPLLs with Bang-Bang Detectors (i.e. coarse midrise TDCs) in combination with a DTC allows same phase-noise performance and fractional-spur level at much lower power consumption; Fine resolution is only required to DCO and DTC, which can be both improved leveraging oversampling techniques ; Bang-Bang DPLLs achieve superior noise/ power trade-off over conventional DPLLs, while reducing design effort.
  • Keywords
    CMOS digital integrated circuits; digital phase locked loops; interference suppression; power consumption; Bang-Bang DPLL; CMOS; DCO; DTC; analog phase-locked loops; bang-bang detectors; calibration algorithms; digital phase-locked loops; noise-cancellation; power consumption; two-point modulation; Charge pumps; Clocks; Frequency modulation; Jitter; Phase locked loops; Phase noise; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2013 IEEE
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/CICC.2013.6658505
  • Filename
    6658505