Title :
Advanced digital phase-locked loops
Author :
Levantino, Salvatore
Author_Institution :
Politec. di Milano, Milan, Italy
Abstract :
Analog PLLs do not scale down as process and are not amenable to noise-cancellation and other calibration algorithms; Digital PLLs exploit CMOS scaling and allow for simple, accurate implementation of digiphase and two-point modulation; Typically, DPLLs require TDCs with tight resolution to achieve low phase noise and fractional-spur level, which increase both power consumption and design effort; DPLLs with Bang-Bang Detectors (i.e. coarse midrise TDCs) in combination with a DTC allows same phase-noise performance and fractional-spur level at much lower power consumption; Fine resolution is only required to DCO and DTC, which can be both improved leveraging oversampling techniques ; Bang-Bang DPLLs achieve superior noise/ power trade-off over conventional DPLLs, while reducing design effort.
Keywords :
CMOS digital integrated circuits; digital phase locked loops; interference suppression; power consumption; Bang-Bang DPLL; CMOS; DCO; DTC; analog phase-locked loops; bang-bang detectors; calibration algorithms; digital phase-locked loops; noise-cancellation; power consumption; two-point modulation; Charge pumps; Clocks; Frequency modulation; Jitter; Phase locked loops; Phase noise; Wireless communication;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA
DOI :
10.1109/CICC.2013.6658505