DocumentCode
2157266
Title
Advanced digital phase-locked loops
Author
Levantino, Salvatore
Author_Institution
Politec. di Milano, Milan, Italy
fYear
2013
fDate
22-25 Sept. 2013
Firstpage
1
Lastpage
95
Abstract
Analog PLLs do not scale down as process and are not amenable to noise-cancellation and other calibration algorithms; Digital PLLs exploit CMOS scaling and allow for simple, accurate implementation of digiphase and two-point modulation; Typically, DPLLs require TDCs with tight resolution to achieve low phase noise and fractional-spur level, which increase both power consumption and design effort; DPLLs with Bang-Bang Detectors (i.e. coarse midrise TDCs) in combination with a DTC allows same phase-noise performance and fractional-spur level at much lower power consumption; Fine resolution is only required to DCO and DTC, which can be both improved leveraging oversampling techniques ; Bang-Bang DPLLs achieve superior noise/ power trade-off over conventional DPLLs, while reducing design effort.
Keywords
CMOS digital integrated circuits; digital phase locked loops; interference suppression; power consumption; Bang-Bang DPLL; CMOS; DCO; DTC; analog phase-locked loops; bang-bang detectors; calibration algorithms; digital phase-locked loops; noise-cancellation; power consumption; two-point modulation; Charge pumps; Clocks; Frequency modulation; Jitter; Phase locked loops; Phase noise; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location
San Jose, CA
Type
conf
DOI
10.1109/CICC.2013.6658505
Filename
6658505
Link To Document