Title :
A congruent compact-cell approach for global EM analysis of multi-scale integrated circuits
Author :
Wane, S. ; Bajon, D. ; Baudrand, H.
Abstract :
A novel macromodeling congruent compact-cell methodology is introduced for full-wave investigations of multi-layered inhomogeneous structures containing elements that differ significantly in their scale and doping profiles. The proposed approach is implemented on the hybrid transverse waves formulation (TWF) leading to important complexity reduction in term of memory requirement and number of unknowns without sacrificing accuracy, thanks to scale analysis. The validity of the compact-cell methodology is demonstrated through numerous realistic RFIC examples including the effects on signal integrity of deep-trench (DT) isolation techniques. Results obtained using the compact-cell methodology are successfully compared to full (regular refined)-simulation results, to commercial design tool results and to measurement data. The approximation of cascade elements classically used in circuit approaches is discussed and its validity is investigated in regard to the compact-cell scale parameter.
Keywords :
circuit complexity; integrated circuit modelling; isolation technology; multilayers; radiofrequency integrated circuits; deep-trench isolation techniques; doping profiles; global electromagnetic analysis; hybrid transverse waves formulation; macromodeling congruent compact-cell methodology; model order reduction; multichip modules; multilayered inhomogeneous structures; multiscale integrated circuits; signal integrity; BiCMOS integrated circuits; Circuit simulation; Doping profiles; Integrated circuit interconnections; Iterative methods; Multichip modules; Radiofrequency integrated circuits; Semiconductor process modeling; Topology; Transfer functions;
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
Print_ISBN :
0-7803-8845-3
DOI :
10.1109/MWSYM.2005.1516862