DocumentCode :
2157645
Title :
The effects of annealing on the behavior of field emission source
Author :
Takahashi, E. ; Takasaki, I. ; Mitsui, H. ; Sone, M.
Author_Institution :
Musashi Inst. of Technol., Tokyo, Japan
Volume :
1
fYear :
1994
fDate :
3-8 Jul 1994
Firstpage :
254
Abstract :
Characteristic of prebreakdown emission current has been studied. It is known that the electrons are emitted from minute projections on the cathode surface where the field strength is more than 10 [V/cm]. We observed the location of emission sites by using a micro-channel-plate with a luminescent screen, and discussed the effects of the heat treatment on the behavior of emission sites. As a result, the heat treatment decreases not only the number of emission sites but also the number of electrons emitted from one projection. And the annealing effect becomes conspicuously with increasing the temperature of annealing
Keywords :
Annealing; Cathodes; Current measurement; Electron emission; Heat pumps; Heat treatment; Insulation; Surface treatment; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-7803-1307-0
Type :
conf
DOI :
10.1109/ICPADM.1994.413987
Filename :
413987
Link To Document :
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