DocumentCode
2157835
Title
Test circuits for verification of power device models
Author
Pendharkar, S. ; Winterhalter, C. ; Trivedi, M. ; Li, H. ; Kurnia, A. ; Divan, D. ; Shenai, K.
Author_Institution
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Volume
2
fYear
1995
fDate
8-12 Oct 1995
Firstpage
1055
Abstract
One of the most important components of any modern power converter topology is the power semiconductor device. To predict the behavior of high-power devices in complex circuits it is necessary to accurately characterize them. Because of the cost involved in building complex circuits, it is often necessary to carry out extensive simulations to understand the device behavior under various operating conditions imposed by the particular circuit topology. For accurate simulations, it is necessary to develop good and accurate device models using advanced device simulation tools. The device models are generally developed using static and some switching measurement data. To verify the accuracy of these models, the simulation data must be compared with the measured data under different operating conditions. Test circuits used to carry out such simulations and measurements must satisfy a number of criteria such as robustness, accuracy, cost efficiency and repeatability. In addition, they should be easy to simulate accurately. This paper presents some simple and accurate test circuits used for the verification of various power device models
Keywords
circuit testing; field effect transistor switches; power MOSFET; power convertors; power field effect transistors; power semiconductor switches; semiconductor device models; semiconductor device testing; MOSFET switches; accuracy; cost efficiency; measurements; power converter topology; power device models verification; power semiconductor; repeatability; robustness; simulations; test circuits; Circuit simulation; Circuit testing; Circuit topology; Computational modeling; Costs; Drives; Power semiconductor devices; Predictive models; Semiconductor device testing; Semiconductor diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
Conference_Location
Orlando, FL
ISSN
0197-2618
Print_ISBN
0-7803-3008-0
Type
conf
DOI
10.1109/IAS.1995.530419
Filename
530419
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