Title :
A stochastic sampling time-to-digital converter with tunable 180–770fs resolution, INL less than 0.6LSB, and selectable dynamic range offset
Author :
Tandon, James S. ; Yamaguchi, Takahiro J. ; Komatsu, Satoshi ; Asada, Kunihiro
Author_Institution :
VDEC-D2T, Univ. of Tokyo, Tokyo, Japan
Abstract :
We introduce a stochastic time-to-digital converter (TDC) that has 180-770fs tunable resolution, less than 0.6LSB INL, and selectable dynamic range offset. Previous arbiter-based TDCs have fine resolution but small dynamic range which is difficult to calibrate. Our approach uses comparators as decision elements to precisely control dynamic range offset.
Keywords :
comparators (circuits); stochastic processes; time-digital conversion; TDC; comparators; dynamic range offset control; selectable dynamic range offset; stochastic sampling time-to-digital converter; Clocks; Dynamic range; Oscilloscopes; Semiconductor device measurement; Timing; Transfer functions; Voltage measurement; TDC; comparator; comparator group; offset voltage; stochastic; time-to-digital converter; variation;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA
DOI :
10.1109/CICC.2013.6658531
