• DocumentCode
    2158107
  • Title

    Probabilistic aspects of crosstalk problems in CMOS ICs

  • Author

    Ababei, Cristinel ; Marculescu, Radu ; Sundarajan, Venkat

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    117
  • Lastpage
    120
  • Abstract
    In this paper we present a probabilistic approach for analyzing the dependence of crosstalk effects on input pattern correlations. In particular, we show that the effects of coupling between interconnections, in current VLSI ICs, are strongly dependent on the spatio-temporal correlations at the primary inputs. Consequently, a smaller fraction of the total number of nets poses true crosstalk problems and only that fraction should be considered at lower levels of abstraction. The analysis is carried out at the logic-level of abstraction, which provides efficient CPU run time and memory usage
  • Keywords
    CMOS integrated circuits; VLSI; circuit simulation; crosstalk; integrated circuit interconnections; probability; CMOS ICs; CPU run time; VLSI; abstraction logic-level; crosstalk problems; input pattern correlations; interconnection coupling; memory usage; primary inputs; probabilistic approach; spatio-temporal correlations; Capacitance; Central Processing Unit; Circuit noise; Crosstalk; Integrated circuit interconnections; Noise level; Pattern analysis; Routing; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE 2000
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-5809-0
  • Type

    conf

  • DOI
    10.1109/CICC.2000.852630
  • Filename
    852630