Title :
Probabilistic aspects of crosstalk problems in CMOS ICs
Author :
Ababei, Cristinel ; Marculescu, Radu ; Sundarajan, Venkat
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
In this paper we present a probabilistic approach for analyzing the dependence of crosstalk effects on input pattern correlations. In particular, we show that the effects of coupling between interconnections, in current VLSI ICs, are strongly dependent on the spatio-temporal correlations at the primary inputs. Consequently, a smaller fraction of the total number of nets poses true crosstalk problems and only that fraction should be considered at lower levels of abstraction. The analysis is carried out at the logic-level of abstraction, which provides efficient CPU run time and memory usage
Keywords :
CMOS integrated circuits; VLSI; circuit simulation; crosstalk; integrated circuit interconnections; probability; CMOS ICs; CPU run time; VLSI; abstraction logic-level; crosstalk problems; input pattern correlations; interconnection coupling; memory usage; primary inputs; probabilistic approach; spatio-temporal correlations; Capacitance; Central Processing Unit; Circuit noise; Crosstalk; Integrated circuit interconnections; Noise level; Pattern analysis; Routing; Very large scale integration; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE 2000
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5809-0
DOI :
10.1109/CICC.2000.852630