DocumentCode
2158107
Title
Probabilistic aspects of crosstalk problems in CMOS ICs
Author
Ababei, Cristinel ; Marculescu, Radu ; Sundarajan, Venkat
Author_Institution
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
fYear
2000
fDate
2000
Firstpage
117
Lastpage
120
Abstract
In this paper we present a probabilistic approach for analyzing the dependence of crosstalk effects on input pattern correlations. In particular, we show that the effects of coupling between interconnections, in current VLSI ICs, are strongly dependent on the spatio-temporal correlations at the primary inputs. Consequently, a smaller fraction of the total number of nets poses true crosstalk problems and only that fraction should be considered at lower levels of abstraction. The analysis is carried out at the logic-level of abstraction, which provides efficient CPU run time and memory usage
Keywords
CMOS integrated circuits; VLSI; circuit simulation; crosstalk; integrated circuit interconnections; probability; CMOS ICs; CPU run time; VLSI; abstraction logic-level; crosstalk problems; input pattern correlations; interconnection coupling; memory usage; primary inputs; probabilistic approach; spatio-temporal correlations; Capacitance; Central Processing Unit; Circuit noise; Crosstalk; Integrated circuit interconnections; Noise level; Pattern analysis; Routing; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE 2000
Conference_Location
Orlando, FL
Print_ISBN
0-7803-5809-0
Type
conf
DOI
10.1109/CICC.2000.852630
Filename
852630
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