• DocumentCode
    2158132
  • Title

    A 40-nm 8T SRAM with selective source line control of read bitlines and address preset structure

  • Author

    Yoshimoto, Shusuke ; Miyano, S. ; Takamiya, Makoto ; Shinohara, Hirofumi ; Kawaguchi, Hitoshi ; Yoshimoto, Masahiko

  • Author_Institution
    Kobe Univ., Kobe, Japan
  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a 40-nm 8T SRAM in which bitlines are partially discharged by a selective source line control (SSLC) for low-power operation. The proposed SSLC scheme reduces a read bitline voltage swing in an unselected column with a floating source line (SL) of dedicated read ports. The SL is controlled by an additional NMOS switch that is turned on in a selected column, but the switch is kept off in the remaining unselected columns. The proposed scheme is effective for power reduction in successive address readouts through a single column. Furthermore, this paper introduces an address preset structure. The preset address enables the SRAM to be read out with no access time penalty for preferred use of the SSLC scheme. We fabricated a 16-Kb 8T SRAM test chip in a 40-nm CMOS process and observed that the proposed SSLC scheme with the address preset structure saves 38.1% of the readout power on average.
  • Keywords
    CMOS integrated circuits; SRAM chips; low-power electronics; readout electronics; 8T SRAM test chip; CMOS process; NMOS switch; SSLC; address preset structure; dedicated read ports; floating source line; low-power operation; power reduction; read bitline voltage swing; read bitlines; selective source line control; size 40 nm; storage capacity 16 Kbit; successive address readouts; unselected column; Conferences; Educational institutions; Energy efficiency; Random access memory; Switches; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2013 IEEE
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/CICC.2013.6658537
  • Filename
    6658537