• DocumentCode
    2158432
  • Title

    A systematic approach to power diode characterization and model validation

  • Author

    Duliere, Jeffrey L. ; Mantooth, H. Alan ; Ferry, R.G.

  • Author_Institution
    Analogy Inc., Beaverton, OR, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    8-12 Oct 1995
  • Firstpage
    1069
  • Abstract
    A process for validating power diode models and characterizing devices to these models is described. This approach has been successfully applied to a number of diode models and a wide variety of diode technologies. This paper concentrates on gathering the necessary data to accurately characterize devices and validate model performance
  • Keywords
    power semiconductor diodes; semiconductor device models; semiconductor device testing; data gathering; diode technologies; model performance; model validation; power diode characterization; Data mining; Design engineering; Electronic components; Light emitting diodes; Physics; Power engineering and energy; Power system modeling; Schottky diodes; Trademarks; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-3008-0
  • Type

    conf

  • DOI
    10.1109/IAS.1995.530421
  • Filename
    530421