DocumentCode
2158530
Title
A 5GS/s 4-bit time-based single-channel CMOS ADC for radio astronomy
Author
Macpherson, Andrew R. ; Haslett, J.W. ; Belostotski, Leonid
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Calgary Calgary, Calgary, AB, Canada
fYear
2013
fDate
22-25 Sept. 2013
Firstpage
1
Lastpage
4
Abstract
A 4-bit 65nm time-based analog-to-digital converter (ADC) targeting the next-generation Square Kilometre Array (SKA) is presented. This ADC is composed of an analog voltage-to-time converter (VTC) front end and a digital time-to-digital converter (TDC) back end. The two components can be physically separated to minimize the impact of digital noise from the ADC on high-gain, high-sensitivity receiver chains common in radio telescopes. At a sampling rate of 5 GS/s the ADC consumes 35 mW from a 1 V supply. After calibration, the ADC achieves a peak SNDR of 22.9 dB, SFDR of 34.0 dB and ENOB of 3.5. At the ERBW of 2100 MHz, SNDR is 18.4 dB, SFDR is 22.3 dB and ENOB is 2.8. The resulting worst-case figure of merit is 1.0 pJ/conversion. This is the highest reported sampling rate for a time-based ADC to date.
Keywords
CMOS integrated circuits; radioastronomy; radiotelescopes; time-digital conversion; ENOB; ERBW; SFDR; SKA; SNDR; TDC back end; VTC front end; analog voltage-to-time converter; digital noise; digital time-to-digital converter; frequency 2100 MHz; high-sensitivity receiver chain; next-generation square kilometre array; power 35 mW; radio astronomy; radio telescope; single-channel CMOS ADC; size 65 nm; time-based analog-to-digital converter; voltage 1 V; word length 4 bit; Arrays; CMOS integrated circuits; Calibration; Clocks; Delays; Frequency measurement; Inverters;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location
San Jose, CA
Type
conf
DOI
10.1109/CICC.2013.6658551
Filename
6658551
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