DocumentCode :
2158530
Title :
A 5GS/s 4-bit time-based single-channel CMOS ADC for radio astronomy
Author :
Macpherson, Andrew R. ; Haslett, J.W. ; Belostotski, Leonid
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Calgary Calgary, Calgary, AB, Canada
fYear :
2013
fDate :
22-25 Sept. 2013
Firstpage :
1
Lastpage :
4
Abstract :
A 4-bit 65nm time-based analog-to-digital converter (ADC) targeting the next-generation Square Kilometre Array (SKA) is presented. This ADC is composed of an analog voltage-to-time converter (VTC) front end and a digital time-to-digital converter (TDC) back end. The two components can be physically separated to minimize the impact of digital noise from the ADC on high-gain, high-sensitivity receiver chains common in radio telescopes. At a sampling rate of 5 GS/s the ADC consumes 35 mW from a 1 V supply. After calibration, the ADC achieves a peak SNDR of 22.9 dB, SFDR of 34.0 dB and ENOB of 3.5. At the ERBW of 2100 MHz, SNDR is 18.4 dB, SFDR is 22.3 dB and ENOB is 2.8. The resulting worst-case figure of merit is 1.0 pJ/conversion. This is the highest reported sampling rate for a time-based ADC to date.
Keywords :
CMOS integrated circuits; radioastronomy; radiotelescopes; time-digital conversion; ENOB; ERBW; SFDR; SKA; SNDR; TDC back end; VTC front end; analog voltage-to-time converter; digital noise; digital time-to-digital converter; frequency 2100 MHz; high-sensitivity receiver chain; next-generation square kilometre array; power 35 mW; radio astronomy; radio telescope; single-channel CMOS ADC; size 65 nm; time-based analog-to-digital converter; voltage 1 V; word length 4 bit; Arrays; CMOS integrated circuits; Calibration; Clocks; Delays; Frequency measurement; Inverters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/CICC.2013.6658551
Filename :
6658551
Link To Document :
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